3D CT x-ray inspection with Techvalley
With the ARIRANG series, Techvalley presents high-performance, flexible CT systems that have been optimized for use in the SMD and semiconductor sectors.
The 360° rotatable table, in combination with the tilting detector, enables non-destructive 3D X-ray inspection of assemblies.
With an image generation time of only 15 seconds, the ARIRANG series is one of the fastest industrial CT systems currently available.
The powerful ARIRANG series meets almost every requirement and x-rays even components embedded in cast iron.
With detail detectability down to 0.4µm and 300,000x magnification, the ARIRANG series makes even the finest details visible to the naked eye.
The multi-axis system with 7 controllable axes ensures absolute precision when controlling the region-of-interest.
The program offers 3D visualization of surfaces and internal structures as well as comprehensive possibilities for data analysis.
With Techvalley's patented iTOP technology (Inspection technology for overlapped patterns), it only takes one image to accurately inspect overlapping structures. With iTOP, inspection of overlapping components is up to 70% faster than conventional laminography processes.
André Rose, 4Source electronics AG
Fedor Minich, Hartmann Electronic
Patrick Kohl, AicTEC
André Rose, 4Source electronics AG
Fedor Minich, Hartmann Electronic
Convince yourself of our X-ray systems with your own eyes during a demo - even directly on your own products!
Techvalleys most powerful CT-system impresses with high resolution x-ray images and an outstanding detail recognition making even finest defects in critical components of any kind reliably visible. The ARIRANG 165CT thus is perfectly suitable for intensive x-ray inspections within the semicondutor sector. The system is compatible with Volume Graphics and offers extensive analysis possibilities.
High resolution 3D x-ray images with an excellent detail recognition and a powerful x-ray tube: The ARIRANG 130 CT is suitable for a broad variety of applications. The system is compatible with Volume Graphics and offers extensive analysis possibilities.