3D CCI by Koh Young

Coatings protect the PCB against environmental impacts. But what if the coating is too thin or defective? Koh Young presents the Neptune C+, the first inline-capable system that completely and non-destructively measures transparent materials in 3D, solving a long-standing challenge in electronics manufacturing.

NEPTUNE C+

With the patented LIFT-Technology and the Neptune C+, Koh Young sets new standards in inspecting transparent materials.

Product photo of 3D CCI System "Neptune" by Koh Young

Neptune C+

  • Complete measurement of transparent materials in 3D

    • Detects defects such as bubbles and cracks up to 200µm in size
    • 3D, 2D and sectional views to analyze the inspection result
    • Detection of splash marks even outside the inspection field
    • AI-supported defect detection

  • Non-destructive thickness measurement

    With the patented LIFT technology, Koh Young presents for the first time a possibility to measure transparent and translucent materials completely and non-destructively in 3D with a high accuracy and repeatability.

  • Measures a variety of materials

    In addition to conformal coatings, the Neptune C+ reliably measures virtually all transparent, translucent and pigmented materials such as epoxy and adhesives.