3D CCI by Koh Young
Coatings protect the PCB against environmental impacts. But what if the coating is too thin or defective? Koh Young presents the Neptune C+, the first inline-capable system that completely and non-destructively measures transparent materials in 3D, solving a long-standing challenge in electronics manufacturing.
NEPTUNE C+
With the patented LIFT-Technology and the Neptune C+, Koh Young sets new standards in inspecting transparent materials.
Neptune C+
-
Complete measurement of transparent materials in 3D
- Detects defects such as bubbles and cracks up to 200µm in size
- 3D, 2D and sectional views to analyze the inspection result
- Detection of splash marks even outside the inspection field
- AI-supported defect detection
-
Non-destructive thickness measurement
With the patented LIFT technology, Koh Young presents for the first time a possibility to measure transparent and translucent materials completely and non-destructively in 3D with a high accuracy and repeatability.
-
Measures a variety of materials
In addition to conformal coatings, the Neptune C+ reliably measures virtually all transparent, translucent and pigmented materials such as epoxy and adhesives.
